文献 | 量子荧光|微型光纤光谱仪-ag贵宾会

since the early pioneering work on efficient organic light-emitting devices (oleds) that was based on both small molecules and polymers, oleds have attracted a great deal of research interest due to their promising applications in full-color flat-panel displays and solid-state lighting [1-5]. intensive research has been conducted into the development of oleds for realizing strong and efficient electroluminescent (el) emission. to date, almost all previous work carried out on organic el emission has involved unpolarized el emission. nevertheless, a number of researchers have reported the results of experiments in which linearly polarized el emissions have been observed [6-17]. this particular avenue of research has been considered to be important because polarized el emission from oleds is of potential use in a range of applications, not just those limited to high-contrast oled displays, but also in efficient backlight sources in liquid crystal (lc) displays, optical data storage, optical communication, and stereoscopic 3d imaging systems [17].

对淀积在玻璃衬底上厚度约60 nm的金银合金溅射薄膜进行硝酸腐蚀脱银处理, 得到纳米多孔金薄膜. 利用自建的波长检测型表面等离子体共振(spr)传感装置研究了腐蚀时间对纳米多孔金薄膜spr特性的影响, 结果发现纳米多孔金薄膜与水溶液接触后在400-900 nm光谱范围内不具有spr效应, 而当薄膜置于空气中时会产生明显的传播等离子体共振吸收峰, 其共振波长随腐蚀时间增加逐渐红移. 纳米多孔金薄膜在空气气氛中的spr效应使其能够用于原位监测气相分子在孔内的吸附, 还可对在液相中吸附的生化分子进行离位测试. 本文对l-谷胱甘肽、l-半胱氨酸、2-氨基乙硫醇三种含巯基的生化小分子在纳米多孔金薄膜内的吸附进行了离位分析, 结果表明与传统的致密金薄膜spr芯片比较, 纳米多孔金薄膜对这些分子显示出更高的灵敏度和更低的检测下限, 这归功于多孔金的大比表面积使其能够吸附大量的生化小分子. 实验还对乙醇蒸气在纳米多孔金薄膜内的吸附进行了原位监测, 发现吸附平衡所用时间较长, 约为160 min.

利用脉冲射频空心阴极等离子体源激发含溴甲烷的工作气体产生等离子体,采用hr4000型高分辨力光谱仪测量了等离子体的发射光谱｡通过光谱比较,在等离子体发射光谱图中得到了位于635.07,700.52nm的溴原子的特征峰,并实验研究了工作气压和溴甲烷密度对溴原子特征峰强度的影响｡实验结果表明:在相同的溴甲烷密度下,溴原子的特征峰强度随气压的升高而降低;在相同的气压条件下,溴原子的特征峰强度随溴甲烷密度的升高而升高;溴甲烷密度测量的精度高于1g/m³｡

a new spectroscopic parameter is used in this paper for on-line arc-welding quality monitoring. plasma spectroscopy applied to welding diagnostics has typically relied on the estimation of the plasma electronic temperature, as there is a known correlation between this parameter and the quality of the seams. however, the practical use of this parameter gives rise to some uncertainties that could provoke ambiguous results. for an efficient on-line welding monitoring system, it is essential to prevent the appearance of false alarms, as well as to detect all the possible defects. in this regard, we propose the use of the root mean square signal of the welding plasma spectra, as this parameter will be proven to exhibit a good correlation with the quality of the resulting seams. results corresponding to several arc-welding field tests performed on inconel and titanium specimens will be discussed and compared to non-destructive evaluation techniques.